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Techné: Research in Philosophy and Technology

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Editor-in-Chief: Joseph C. Pitt, Virginia Tech
Editor: Peter-Paul Verbeek, University of Twente
Editor: Pieter Vermaas, Delft University of Technology
Book Review Editor: Tom Staley, Virginia Tech (tstaley@vt.edu)
Managing Editor: Ashley Shew (technejournal@gmail.com)

Number 2
Spring 2008
Volume 12
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Editor-in-Chief Joseph C. Pitt, Virginia Tech jcpitt@vt.edu
Editors Peter-Paul Verbeek, University of Twente
Pieter Vermaas, Delft University of Technology
Book Review Editor: Tom Staley, Virginia Tech tstaley@vt.edu
Managing Editor: Ashley Shew technejournal@gmail.com

CONTENTS

Special Issue:
Postphenomenology: Historical and Contemporary Horizons

Special Issue Editor Evan Sclinger, Rochester Institute of Technology



Introduction to Postphenomenology Discussion
EVAN SELINGER[PDF   76 KB]

Postphenomenology and Pragmatism: Closer Than You Might Think?
LARRY A. HICKMAN[PDF   136 KB]

Ihde’s Instrumental Realism and the Marxist Account of Technology in Experimental Science
VAL DUSEK[PDF   120 KB]

Human—Technology—World
DENNIS M. WEISS[PDF   152 KB]

Normative Judgment and Technoscience: Nudging Ihde, Again
EVAN SELINGER[PDF   120 KB]

The Corpus is Not Yet Closed...
DON IHDE[PDF   116 KB]

DLA Ejournal Home | SPT Home | Table of Contents for this issue | Search SPT and other ejournals

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Last modified on: 08/26/09 14:37:00 by ASL