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Techné: Research in Philosophy and Technology

Editor-in-Chief: Joseph C. Pitt, Virginia Tech
Editor: Peter-Paul Verbeek, University of Twente
Editor: Pieter Vermaas, Delft University of Technology
Book Review Editor: Tom Staley, Virginia Tech (tstaley@vt.edu)
Managing Editor: Ashley Shew (technejournal@gmail.com)

View the index of articles available in PDF

Editor, Davis Baird db@sc.edu
Editorial Assistant, Sid Littlefield littleft@mailbox.sc.edu

Contents

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Special Issue: Nanotech Challenges, Part II

Edited by Davis Baird & Joachim Schummer
Jointly published with Hyle.

Editorial: Nanotech Challenges, Part II
DAVIS BAIRD & JOACHIM SCHUMMER

Noumenal Technology: Reflections on the Incredible Tininess of Nano
ALFRED NORDMANN

When is an Image Not an Image?
JOSEPH C. PITT

Beyond Truth: Pleasure of Nanofutures
ARNE HESSENBRUCH

Analyzing the Complexity of Nanotechnology
MARC J. DE VRIES

Reviews

Feynman Unprocessed
CHRIS TOUMEY

Hyle: Nanotech Challenges, Part II

Editorial: Nanotech Challenges, Part II
DAVIS BAIRD & JOACHIM SCHUMMER

What Counts as a 'Social and Ethical Issue' in Nanotechnology?
BRUCE V. LEWENSTEIN

The Promise and Threat of Nanotechnology: Can Environmental Ethics Guide US?
CHRISTOPHER J. PRESTON

Nanosciences and its Convergence with other Technologies: New Golden Age or Apocalypse?
LOUIS LAURENT & JEAN-CLAUDE PETIT

Nanotechnology and Nature: On Two Criteria for Understanding their Relationship
GREGOR SCHIEMANN

Reviews

Davis Baird: "Thing Knowledge: A Philosophy of Scientific Instruments
JOSEPH C. PITT

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Virginia Tech, P.O. Box 90001,
Blacksburg, VA 24062-9001

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