Title page for ETD etd-02052003-162036


Type of Document Master's Thesis
Author Qian, Jingen
URN etd-02052003-162036
Title RF Models for Active IPEMs
Degree Master of Science
Department Electrical and Computer Engineering
Advisory Committee
Advisor Name Title
van Wyk, Jacobus Daniel Committee Chair
Odendaal, Willem Gerhardus Committee Co-Chair
Chen, Dan Y. Committee Member
Keywords
  • electromagnetic interference (EMI)
  • integrated power electronic module (IPEM)
  • impedance
  • radio frequency (RF)
  • parasitics extraction
Date of Defense 2003-01-31
Availability unrestricted
Abstract
Exploring RF models for an integrated power electronics module (IPEM) is crucial to analyzing and predicting its EMI performance. This thesis deals with the parasitics extraction approach for an active IPEM in a frequency range of 1MHz through 30MHz.

Based on the classic electromagnetic field theory, the calculating equations of DC and AC parameters for a 3D conducting structure are derived. The influence of skin effect and proximity effect on AC resistances and inductances is also investigated at high frequencies.

To investigate RF models and EMI performance of the IPEM, a 1kW 1MHz series resonant DC-DC converter (SRC) is designed and fabricated in this work. For extracting the stray parameters of the built IPEM, two main software simulation tools ¡ª Maxwell Quick 3D Parameter Extractor (Maxwell Q3D) and Maxwell 3D Field Simulator (Maxwell 3D), prevailing electromagnetic simulation products from Ansoft Corporation, are introduced in this study. By trading off between the numerical accuracy and computational economy (CPU time and consumption of memory size), Maxwell Q3D is chosen in this work to extract the parameters for the full bridge IPEM structure. The step-by-step procedure of using Maxwell Q3D is presented from pre-processing the 3D IPEM structure to post-processing the solutions, and exporting equivalent circuit for PSpice simulations as well. RF modeling of power MOSFETs is briefly introduced.

In order to verify extracted parameters, in-circuit impedance measurements for the IPEM using Agilent 4294A Impedance Analyzer together with Agilent 42941A probe are then followed. Measured results basically verify the extracted data, while the discrepancy between measured results and simulated results is also analyzed.

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