Title page for ETD etd-02162010-020508
|Type of Document
||Braski, David N
||An x-ray diffraction method for studying small diffusion zones.
||Master of Science
|Houska, Charles R.
|Date of Defense
An X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concentration-penetration curves across the diffusion zone. the experimental curves are in general agreement with a new mathematical analysis and also the diffusion coefficients reported in the literature.
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