Title page for ETD etd-03122009-040453


Type of Document Master's Thesis
Author Buttram, Jonathan D
URN etd-03122009-040453
Title Characterization of high temperature creep in siliconized silicon carbide using ultrasonic techniques
Degree Master of Science
Department Engineering Science and Mechanics
Advisory Committee
Advisor Name Title
Duke, John C. Jr. Committee Chair
Cramer, Mark S. Committee Member
Stinchcomb, Wayne W. Committee Member
Keywords
  • Creep testing machines
Date of Defense 1990-04-04
Availability restricted
Abstract
see document
Files
  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
[VT] LD5655.V855_1990.B988.pdf 49.09 Mb 03:47:14 01:56:52 01:42:15 00:51:07 00:04:21
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