Type of Document	Master's Thesis
Author	Buttram, Jonathan D
URN	etd-03122009-040453
Title	Characterization of high temperature creep in siliconized silicon carbide using ultrasonic techniques
Degree	Master of Science
Department	Engineering Science and Mechanics
Advisory Committee	Advisor Name Title Duke, John C. Jr. Committee Chair Cramer, Mark S. Committee Member Stinchcomb, Wayne W. Committee Member
Keywords	Creep testing machines
Date of Defense	1990-04-04
Availability	restricted
Abstract see document
Files	Filename       Size       Approximate Download Time (Hours:Minutes:Seconds)     28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access  LD5655.V855_1990.B988.pdf 49.09 Mb 03:47:14 01:56:52 01:42:15 00:51:07 00:04:21 next to an author's name indicates that all files or directories associated with their ETD are accessible from the Virginia Tech campus network only.

If you have questions or technical problems, please Contact DLA.