Title page for ETD etd-05122004-121332


Type of Document Master's Thesis
Author Bhaduri, Debayan
Author's Email Address dbhaduri@vt.edu
URN etd-05122004-121332
Title Tools and Techniques for Evaluating Reliability Trade-offs for Nano-Architectures
Degree Master of Science
Department Electrical and Computer Engineering
Advisory Committee
Advisor Name Title
Shukla, Sandeep K. Committee Chair
Ha, Dong Sam Committee Member
Ravindran, Binoy Committee Member
Keywords
  • interconnect noise
  • probabilistic model checking
  • entropy
  • CTMR
  • granularity
  • PRISM
  • reliability
  • Gaussian
  • defect-tolerant architecture
  • modeling
  • TMR
  • Gibbs distribution
  • Nanotechnology
Date of Defense 2004-04-30
Availability unrestricted
Abstract
It is expected that nano-scale devices and interconnections will introduce unprecedented level of defects in the substrates, and architectural designs need to accommodate the uncertainty inherent at such scales. This consideration motivates the search for new architectural paradigms based on redundancy based defect-tolerant designs. However, redundancy is not always a solution to the reliability problem, and often too much or too little redundancy may cause degradation in reliability. The key challenge is in determining the granularity at which defect tolerance is designed, and the level of redundancy to achieve a specific level of reliability. Analytical probabilistic models to evaluate such reliability-redundancy trade-offs are error prone and cumbersome, and do not scale well for complex networks of gates. In this thesis we develop different tools and techniques that can evaluate the reliability measures of combinational circuits, and can be used to analyze reliability-redundancy trade-offs for different defect-tolerant architectural configurations. In particular, we have developed two tools, one of which is based on probabilistic model checking and is named NANOPRISM, and another MATLAB based tool called NANOLAB. We also illustrate the effectiveness of our reliability analysis tools by pointing out certain anomalies which are counter-intuitive but can be easily discovered by these tools, thereby providing better insight into defect tolerant

design decisions. We believe that these tools will help furthering research and pedagogical interests in this area, expedite the reliability analysis process and enhance the accuracy of establishing reliability-redundancy trade-off points.

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