| Type of Document |
Dissertation |
| Author |
Muthukrishnan, N. Moorthy
|
| URN |
etd-06062008-151045 |
| Title |
Characterization and modeling of dry etch processes for titanium nitride and titanium films in C2/N2 and BCl3 plasmas |
| Degree |
PhD |
| Department |
Electrical Engineering |
| Advisory Committee |
| Advisor Name |
Title |
| Elshabini-Riad, Aicha A. |
Committee Chair |
| Ameriadis, Kostas |
Committee Member |
| Farkas, Diana |
Committee Member |
| Su, Wansheng |
Committee Member |
| Wang, Anbo |
Committee Member |
|
| Keywords |
- titanium
- plasma etch
- titanium nitride
- response surface methodology
- chlorine
- boron trichloride
|
| Date of Defense |
1996-11-04 |
| Availability |
restricted |
Abstract
Not available until OCRd
|
| Files |
| Filename |
Size |
Approximate Download Time
(Hours:Minutes:Seconds) |
| 28.8 Modem |
56K Modem |
ISDN (64 Kb) |
ISDN (128 Kb) |
Higher-speed Access |
![[VT]](http://scholar.lib.vt.edu/images/ETD-db/restricted.gif) |
LD5655.V856_1996.M884.pdf |
6.88 Mb |
00:31:50 |
00:16:22 |
00:14:19 |
00:07:09 |
00:00:36 |
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