| Type of Document |
Dissertation |
| Author |
Chen, Jhewn-Kuang
|
| URN |
etd-06062008-162241 |
| Title |
The role of defects during precipitate growth in a Ni-45wt% Cr alloy |
| Degree |
PhD |
| Department |
Materials Engineering Science |
| Advisory Committee |
| Advisor Name |
Title |
| Reynolds, William T. Jr. |
Committee Chair |
| Desu, Seshu B. |
Committee Member |
| Farkas, Diana |
Committee Member |
| Gibbs, Gerald V. |
Committee Member |
| Howe, J. M. |
Committee Member |
| Kampe, Stephen L. |
Committee Member |
|
| Keywords |
- habit plane
- lattice correspondence
- interfacial structure
- precipitate morphology
- atomic matching
|
| Date of Defense |
1995-09-17 |
| Availability |
restricted |
Abstract
see document
|
| Files |
| Filename |
Size |
Approximate Download Time
(Hours:Minutes:Seconds) |
| 28.8 Modem |
56K Modem |
ISDN (64 Kb) |
ISDN (128 Kb) |
Higher-speed Access |
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LD5655.V856_1995.C445.pdf |
23.19 Mb |
01:47:23 |
00:55:13 |
00:48:19 |
00:24:09 |
00:02:03 |
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