Type of Document	Dissertation
Author	Cho, Chang H.
URN	etd-06062008-170406
Title	A formal model for behavioral test generation
Degree	PhD
Department	Electrical Engineering
Advisory Committee	Advisor Name Title Armstrong, James R. Committee Chair Brown, Ezra A. Committee Member Gray, Festus Gail Committee Member Ha, Dong Sam Committee Member Tront, Joseph G. Committee Member
Keywords	Integrated circuits
Date of Defense	1994-02-08
Availability	restricted
Abstract see document
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