Title page for ETD etd-06062008-170406


Type of Document Dissertation
Author Cho, Chang H.
URN etd-06062008-170406
Title A formal model for behavioral test generation
Degree PhD
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Armstrong, James R. Committee Chair
Brown, Ezra A. Committee Member
Gray, Festus Gail Committee Member
Ha, Dong Sam Committee Member
Tront, Joseph G. Committee Member
Keywords
  • Integrated circuits
Date of Defense 1994-02-08
Availability restricted
Abstract
see document
Files
  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
[VT] LD5655.V856_1994.C56.pdf 5.60 Mb 00:25:54 00:13:19 00:11:39 00:05:49 00:00:29
[BTD] next to an author's name indicates that all files or directories associated with their ETD are accessible from the Virginia Tech campus network only.

Browse All Available ETDs by ( Author | Department )

dla home
etds imagebase journals news ereserve special collections
virgnia tech home contact dla university libraries

If you have questions or technical problems, please Contact DLA.