Title page for ETD etd-06102012-040427


Type of Document Master's Thesis
Author Agrawal, Chandra Prakash
URN etd-06102012-040427
Title Full-field deformation measurement in wood using digital image processing
Degree Master of Science
Department Wood Science and Forest Products
Advisory Committee
Advisor Name Title
Conners, Richard W. Committee Member
Henneke, Edmund G. II Committee Member
Loferski, Joseph R. Committee Member
McNeill, Stephen R. Committee Member
Keywords
  • Image processing
Date of Defense 1989-08-18
Availability restricted
Abstract

A digital image processing system was used to non-destructively measure the full-field deformation on aluminum and wood specimens loaded in compression and bending. The measurement technique consisted of creating a random speckle pattern on the specimen surface, recording images before deformation and after deformation, and computing the relative displacements of small image subsets. Two methods for producing speckle patterns on the specimens were studied: spray paint and adhesive-backed photographic film.

Baseline tests were conducted to evaluate the influence of signal noise on the measurement system. Uniform translation tests were conducted to evaluate the capability of the system for measuring finite motion. the technique was used to monitor the full-field deformation response of aluminum and wood specimens tested in bending and static compression. Moderate duration compression creep tests were conducted, on the wood specimens to investigate the suitability of the system for monitoring the creep response of materials. The results obtained from the two speckle techniques were also. compared. The results showed that for the magnification and speckle patterns tested displacement measurements smaller than 3.29x10-4 inch may be unreliable due to signal noise.

Files
  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
[VT] LD5655.V855_1989.A363.pdf 4.27 Mb 00:19:45 00:10:09 00:08:53 00:04:26 00:00:22
[BTD] next to an author's name indicates that all files or directories associated with their ETD are accessible from the Virginia Tech campus network only.

Browse All Available ETDs by ( Author | Department )

dla home
etds imagebase journals news ereserve special collections
virgnia tech home contact dla university libraries

If you have questions or technical problems, please Contact DLA.