| Type of Document |
Master's Thesis |
| Author |
Dietrich, Frank E.
|
| URN |
etd-06122010-020211 |
| Title |
An X-ray study of the behavior of titanium films on silicon substrates. |
| Degree |
Master of Science |
| Department |
Metallurgical Engineering |
| Advisory Committee |
| Advisor Name |
Title |
| Houska, Charles R. |
Committee Chair |
| Floridis, T. P. |
Committee Member |
| Hibbard, W. R. Jr. |
Committee Member |
| Lytton, Jack L. |
Committee Member |
|
| Keywords |
|
| Date of Defense |
1977-06-15 |
| Availability |
restricted |
Abstract
see document
|
| Files |
| Filename |
Size |
Approximate Download Time
(Hours:Minutes:Seconds)
|
| 28.8 Modem |
56K Modem |
ISDN (64 Kb) |
ISDN (128 Kb) |
Higher-speed Access |
![[VT]](http://scholar.lib.vt.edu/images/ETD-db/restricted.gif) |
LD5655.V855_1977.D54.pdf |
10.87 Mb |
00:50:18 |
00:25:52 |
00:22:38 |
00:11:19 |
00:00:57 |
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