Type of Document	Dissertation
Author	Kim, Yoon G.
URN	etd-06192006-125721
Title	A response surface approach to data analysis in robust parameter design
Degree	PhD
Department	Statistics
Advisory Committee	Advisor Name Title Myers, Raymond H. Committee Chair Hinkelmann, Klaus H. Committee Member Holtzman, Golde I. Committee Member Krutchkoff, Richard G. Committee Member Pirie, Walter R. Committee Member
Keywords	Robust statistics
Date of Defense	1992-09-15
Availability	restricted
Abstract It has become obvious that combined arrays and a response surface approach can be effective tools in our quest to reduce (process) variability. An important aspect of the improvement of quality is to suppress the magnitude of the influence coming from subtle changes of noise factors. To model and control process variability induced by noise factors we take a response surface approach. The derivative of the standard response function with respect to noise factors, i. e., the slopes of the response function in the direction of the noise factors, play an important role in the study of the minimum process variance. For better understanding of the process variability, we study various properties of both biased and the unbiased estimators of the process variance. Response surface modeling techniques and the ideas involved with variance modeling and estimation through the function of the aforementioned derivatives is a valuable concept in this study. In what follows, we describe the use of the response surface methodology for situations in which noise factors are used. The approach is to combine Taguchi's notion of heterogeneous variability with standard design and modeling techniques available in response surface methodology.
Files	Filename       Size       Approximate Download Time (Hours:Minutes:Seconds)     28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access  LD5655.V856_1992.K5595.pdf 3.01 Mb 00:13:56 00:07:10 00:06:16 00:03:08 00:00:16 next to an author's name indicates that all files or directories associated with their ETD are accessible from the Virginia Tech campus network only.

If you have questions or technical problems, please Contact DLA.