Title page for ETD etd-07242012-040138


Type of Document Master's Thesis
Author Lam, Fong-Shek
URN etd-07242012-040138
Title Test generation for behavioral models with reconvergent fanout and feed-back
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Armstrong, James R. Committee Chair
Midkiff, Scott F. Committee Member
Tront, Joseph G. Committee Member
Keywords
  • Integrated circuits
Date of Defense 1989-09-15
Availability restricted
Abstract

In this thesis, new methods to handle reconvergent fanout and feed-back during behavioral level test generation are proposed. These methods have been implemented - into a previously developed automatic test generator. The improved test generator was tested on five behavioral circuit models. For circuits with the reconvergent fanout situation, the improved test generator can generate tests completely automatically. For circuits with feed-back, user assistance in a circuit initialization step is required. Some suggestions for future development for the test generator are discussed. Examples on how to use the improved test generator are presented.

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