Title page for ETD etd-07282008-134708


Type of Document Dissertation
Author Bollinger, S. Wayne
URN etd-07282008-134708
Title Hierarchical test generation for CMOS circuits
Degree PhD
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Midkiff, Scott F. Committee Chair
Armstrong, James R. Committee Member
Gray, Festus Gail Committee Member
Kafura, Dennis G. Committee Member
Tront, Joseph G. Committee Member
Keywords
  • Integrated circuits
Date of Defense 1992-03-05
Availability restricted
Abstract
see document
Files
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 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
[VT] LD5655.V856_1992.B644.pdf 6.07 Mb 00:28:06 00:14:27 00:12:38 00:06:19 00:00:32
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