Type of Document	Dissertation
Author	Bollinger, S. Wayne
URN	etd-07282008-134708
Title	Hierarchical test generation for CMOS circuits
Degree	PhD
Department	Electrical Engineering
Advisory Committee	Advisor Name Title Midkiff, Scott F. Committee Chair Armstrong, James R. Committee Member Gray, Festus Gail Committee Member Kafura, Dennis G. Committee Member Tront, Joseph G. Committee Member
Keywords	Integrated circuits
Date of Defense	1992-03-05
Availability	restricted
Abstract see document
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