Title page for ETD etd-090799-120831


Type of Document Dissertation
Author Steeno, Gregory Sean
Author's Email Address gregory_s_steeno@groton.pfizer.com
URN etd-090799-120831
Title Robust and Nonparametric Methods for Topology Error Identification and Voltage Calibration in Power Systems Engineering
Degree PhD
Department Statistics
Advisory Committee
Advisor Name Title
Coakley, Clint W. Committee Co-Chair
Mili, Lamine M. Committee Co-Chair
Birch, Jeffrey B. Committee Member
Terrell, George R. Committee Member
VanLandingham, Hugh F. Committee Member
Keywords
  • Test Resistance
  • State Estimation
  • Rank Tests
  • Brown-Mood
  • Friedman
Date of Defense 1999-08-03
Availability restricted
Abstract

There is a growing interest in robust and nonparametric methods with engineering applications, due to the nature of the data. Here, we study two power systems engineering applications that employ or recommend robust and nonparametric methods; topology error identification and voltage calibration.

Topology errors are a well-known, well-documented problem for utility companies. A topology error occurs when a line's status in a power network, whether active or deactive, is misclassified. This will lead to an incorrect Jacobian matrix used to estimate the unknown parameters of a network in a nonlinear regression model. We propose a solution using nonlinear regression techniques to identify the correct status of every line in the network by deriving a statistical model of the power flows and injections while employing Kirchhoff's Current Law. Simulation results on the IEEE-118 bus system showed that the methodology was able to detect where topology errors occurred as well as identify gross measurement errors.

The Friedman Two-Way Analysis of Variance by Ranks test is advocated to calibrate voltage measurements at a bus in a power network. However, it was found that the Friedman test was only slightly more robust or resistant in the presence of discordant measurements than the classical F-test. The resistance of a statistical test is defined as the fraction of bad data necessary to switch a statistical conclusion. We mathematically derive the maximum resistance to rejection and to acceptance of the Friedman test, as well as the Brown-Mood test, and show that the Brown-Mood test has a higher maximum resistance to rejection and to acceptance than the Friedman test. In addition, we simulate the expected resistance to rejection and to acceptance of both tests and show that on average the Brown-Mood test is slightly more robust to rejection while on average the Friedman test is more robust to acceptance.

Files
  Filename       Size       Approximate Download Time (Hours:Minutes:Seconds) 
 
 28.8 Modem   56K Modem   ISDN (64 Kb)   ISDN (128 Kb)   Higher-speed Access 
[VT] AppendixA.pdf 17.39 Kb 00:00:04 00:00:02 00:00:02 00:00:01 < 00:00:01
[VT] AppendixB.pdf 49.02 Kb 00:00:13 00:00:07 00:00:06 00:00:03 < 00:00:01
[VT] AppendixC.pdf 172.64 Kb 00:00:47 00:00:24 00:00:21 00:00:10 < 00:00:01
[VT] AppendixD.pdf 25.00 Kb 00:00:06 00:00:03 00:00:03 00:00:01 < 00:00:01
[VT] AppendixE.pdf 20.91 Kb 00:00:05 00:00:02 00:00:02 00:00:01 < 00:00:01
[VT] Bibliography.pdf 18.32 Kb 00:00:05 00:00:02 00:00:02 00:00:01 < 00:00:01
[VT] Chapter1.pdf 23.92 Kb 00:00:06 00:00:03 00:00:02 00:00:01 < 00:00:01
[VT] Chapter2.pdf 49.62 Kb 00:00:13 00:00:07 00:00:06 00:00:03 < 00:00:01
[VT] Chapter3.pdf 77.92 Kb 00:00:21 00:00:11 00:00:09 00:00:04 < 00:00:01
[VT] Chapter4.pdf 19.16 Kb 00:00:05 00:00:02 00:00:02 00:00:01 < 00:00:01
[VT] Chapter5.pdf 103.39 Kb 00:00:28 00:00:14 00:00:12 00:00:06 < 00:00:01
[VT] Chapter6.pdf 71.81 Kb 00:00:19 00:00:10 00:00:08 00:00:04 < 00:00:01
[VT] Chapter7.pdf 78.12 Kb 00:00:21 00:00:11 00:00:09 00:00:04 < 00:00:01
[VT] Chapter8.pdf 36.83 Kb 00:00:10 00:00:05 00:00:04 00:00:02 < 00:00:01
[VT] Chapter9.pdf 10.61 Kb 00:00:02 00:00:01 00:00:01 < 00:00:01 < 00:00:01
[VT] Title1.pdf 7.79 Kb 00:00:02 00:00:01 < 00:00:01 < 00:00:01 < 00:00:01
[VT] Title2.pdf 20.72 Kb 00:00:05 00:00:02 00:00:02 00:00:01 < 00:00:01
[VT] Vitae.pdf 5.16 Kb 00:00:01 < 00:00:01 < 00:00:01 < 00:00:01 < 00:00:01
[VT] indicates that a file or directory is accessible from the Virginia Tech campus network only.

Browse All Available ETDs by ( Author | Department )

dla home
etds imagebase journals news ereserve special collections
virgnia tech home contact dla university libraries

If you have questions or technical problems, please Contact DLA.