The problem of fault detection and location in modular tree
structures are considered in this thesis. The fault set is restricted
to stuck—at faults in the discussion of the fault location problem.
Short circuit faults and broken and short circuit faults are considered
in the discussion of the fault detection problem.
In either the fault detection or location case, detection conditions
for each fault in a cell are derived. Tests for locating or detecting
fault are designed based on providing those detection conditions
to each cell in a tree. For fault detection, the more detection
conditions provided by a test, the better the test is. The detection
conditions provided by the detection test must be partitioned into
single element blocks to locate faults. In this thesis, two algorithms
in
for fault detection and three for fault location in a combinational
modular tree with n input variables are presented in detail. All the
above results are directly modified for fault detection and location
in modular trees which realize arbitrary definite machines. Since a
pair of these tree structures can be connected to realize arbitrary
sequential machines, the results derived here are useful in diagnosing
sequential machines.
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