Title page for ETD etd-11292012-040100


Type of Document Master's Thesis
Author Koe, Wern-Yan
URN etd-11292012-040100
Title An investigation of sensitization conditions and test effectiveness for CMOS faults
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Midkiff, Scott F. Committee Chair
Ha, Dong Sam Committee Member
Tront, Joseph G. Committee Member
Keywords
  • Metal oxide semiconductors - Complementary
Date of Defense 1989-11-15
Availability restricted
Abstract

Testing of digital circuits ensures functionality and reliability ofthe circuits. Previous research has addressed the inadequacies of conventional test methods based on line stuck-at faults in testing CMOS circuits and has proposed new test methods. In this research, the effectiveness of propagation delay testing for open and short faults and supply current monitoring for short faults is investigated. Representative circuits are modeled and simulated over a wide range of fault severities. Factors, such as circuit and fault features, that affect test effectiveness are evaluated and analyzed. From the results, general conclusions are drawn and future research is proposed.

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