Title page for ETD etd-11292012-040100
|Type of Document
||An investigation of sensitization conditions and test effectiveness for CMOS faults
||Master of Science
|Midkiff, Scott F.
|Ha, Dong Sam
|Tront, Joseph G.
- Metal oxide semiconductors - Complementary
|Date of Defense
Testing of digital circuits ensures functionality and reliability ofthe circuits. Previous research
has addressed the inadequacies of conventional test methods based on line stuck-at faults in
testing CMOS circuits and has proposed new test methods. In this research, the effectiveness
of propagation delay testing for open and short faults and supply current monitoring for short
faults is investigated. Representative circuits are modeled and simulated over a wide range
of fault severities. Factors, such as circuit and fault features, that affect test effectiveness are
evaluated and analyzed. From the results, general conclusions are drawn and future research
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