Title page for ETD etd-12302008-063234


Type of Document Master's Thesis
Author Jett, David B.
URN etd-12302008-063234
Title Selection of flip-flops for partial scan paths by use of a statistical testability measure
Degree Master of Science
Department Electrical Engineering
Advisory Committee
Advisor Name Title
Ha, Dong Sam Committee Member
Midkiff, Scott F. Committee Member
Tront, Joseph G. Committee Member
Keywords
  • Digital integrated circuits
Date of Defense 1992-09-05
Availability restricted
Abstract

Partial scan paths improve the testability of digital circuits, and incur minimal costs in the area overhead and test application time. Design constraints may require that a partial scan path include only those flip-flops that provide the greatest improvements in circuit testability. STAFFS, a tool that identifies such flip-flops, has been developed. It uses a statistical testability measure to acquire quantitative data for the controllabilities and observabilities of the nodes of a circuit. It predicts the changes that would occur in the data due to the scanning of specific flip-flops, and uses those predictions to select flip-flops. STAFFS weights the observability data versus the controllability data when selecting flip-flops, and it can efficiently select alternative scan designs for different weights. Experimental results for thirteen sequential benchmark circuits reveal that STAFFS consistently selects scan designs with fault coverages that are significantly higher than those of arbitrarily selected scan designs.

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