
| Document Type: | Dissertation |
| Name: | Todd P. St. Clair |
| Email address: | tstclair@vt.edu |
| URN: | 1998/00733 |
| Title: | Characterization and Reactivity of Mo2C |
| Degree: | Doctor of Philosophy |
| Department: | Chemical Engineering |
| Committee Chair: | David F. Cox |
| Chair's email: | dfcox@vt.edu |
| Committee Members: | S. Ted Oyama, Co-chair |
| John G. Dillard | |
| Brian E. Hanson | |
| Michael F. Hochella | |
| Keywords: | single crystal molybdenum carbide, thiophene desulfurization |
| Date of defense: | June 4, 1998 |
| Availability: | Release the entire work for Virginia Tech access only.
After one year release worldwide only with written permission of the student and the advisory committee chair. |
Two types of Mo2C have been investigated: polycrystalline beta-Mo2C and single crystal alpha-Mo2C. The beta-Mo2C material was synthesized via a temperature-programmed method, and then characterized using x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS), CO chemisorption, and N2 physisorption. The catalytic activity of the beta-Mo2C was tested for cumene hydrogenation under high pressure conditions, and the effect of sulfur and oxygen poisons on cumene hydrogenation was also investigated. As a complement to the work done on polycrystalline beta-Mo2C, UHV studies of single crystal alpha-Mo2C were undertaken to provide fundamental information about a well-characterized Mo2C surface. The (0001) surface of alpha-Mo2C was investigated using XPS and low energy electron diffraction (LEED). It was found that an ion-bombarded surface could be prepared as either Mo-terminated or C-terminated by choosing either low annealing temperatures (~1000 K) or high annealing temperatures (~1500 K), respectively. CO and O2 adsorption was also studied on alpha-Mo2C (0001) using thermal desorption spectroscopy (TDS), XPS, Auger electron spectroscopy (AES), and LEED. Finally, thiophene adsorption was investigated on alpha-Mo2C (0001).
List of Attached Files | ||
| diss.PDF | ||
|
At the author's request, all materials (PDF files, images, etc.) associated with this ETD are accessible from the Virginia Tech network only. |
![]() |