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Techné: Research in Philosophy and Technology |
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Editor-in-Chief: Joseph C. Pitt, Virginia Tech, Vol. 11, no. 1 (Fall 2007) -
previous editors: Paul Durbin 1995/97; Peter Tijmes 1997/99; Davis Baird 2000/07
previous editors: Paul Durbin 1995/97; Peter Tijmes 1997/99; Davis Baird 2000/07
Number 2
Spring 2009
Volume 13
Special Issue Editors:
Wybo Houkes, Eindhoven Univ. of Technology
Pieter Vermaas, Delft University of Technology
Wybo Houkes, Eindhoven Univ. of Technology
Pieter Vermaas, Delft University of Technology
Special Issue: Artefacts in Analytic Metaphysics
Front CoverPDF [46 KB]
Table of ContentsPDF [38 KB]
Complete IssuePDF [1.4 MB]
CONTENTS
Artefacts in Analytic Metaphysics: Introduction
WYBO HOUKES and PIETER E. VERMAASPDF [152 KB]HTML [34 KB]
The Metaphysics of Malfunction
LYNNE RUDDER BAKERPDF [192 KB]HTML [45 KB]
Antirealism and Artefact Kinds
MARZIA SOAVIPDF [229 KB]HTML [58 KB]
Relative Identity and the Number of Artifacts
MASSIMILIANO CARRARAPDF [265 KB]HTML [56 KB]
Produced to Use: Combining Two Key Intuitions on the Nature of Artefacts
WYBO HOUKES and PIETER E. VERMAASPDF [217 KB]HTML [60 KB]
What is an Artefact Design
PAWEL GARBACZPDF [424 KB]HTML [52 KB]
Structure and Coherence of Two-Model-Descriptions of Technical Artefacts
ULRICH KROHSPDF [255 KB]HTML [49 KB]
BOOK REVIEWSPDF [232 KB]HTML [52 KB]
