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Techné: Research in Philosophy and Technology

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Editor-in-Chief: Joseph C. Pitt, Virginia Tech, Vol. 11, no. 1 (Fall 2007) -
previous editors: Paul Durbin 1995/97; Peter Tijmes 1997/99; Davis Baird 2000/07

Number 2
Spring 2009
Volume 13

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Special Issue Editors:
Wybo Houkes, Eindhoven Univ. of Technology
Pieter Vermaas, Delft University of Technology

Special Issue: Artefacts in Analytic Metaphysics

Front Cover PDF [46 KB]

Table of Contents PDF [38 KB]

Complete Issue PDF [1.4 MB]

CONTENTS


Artefacts in Analytic Metaphysics: Introduction
WYBO HOUKES and PIETER E. VERMAAS PDF [152 KB] HTML [34 KB]

The Metaphysics of Malfunction
LYNNE RUDDER BAKER PDF [192 KB] HTML [45 KB]

Antirealism and Artefact Kinds
MARZIA SOAVI PDF [229 KB] HTML [58 KB]

Relative Identity and the Number of Artifacts
MASSIMILIANO CARRARA PDF [265 KB] HTML [56 KB]

Produced to Use: Combining Two Key Intuitions on the Nature of Artefacts
WYBO HOUKES and PIETER E. VERMAAS PDF [217 KB] HTML [60 KB]

What is an Artefact Design
PAWEL GARBACZ PDF [424 KB] HTML [52 KB]

Structure and Coherence of Two-Model-Descriptions of Technical Artefacts
ULRICH KROHS PDF [255 KB] HTML [49 KB]

BOOK REVIEWS PDF [232 KB] HTML [52 KB]


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