Virginia Tech Digital Library and Archives

Techné: Research in Philosophy and Technology

Editor-in-Chief: Joseph C. Pitt, Virginia Tech
Editor: Peter-Paul Verbeek, University of Twente
Editor: Pieter Vermaas, Delft University of Technology
Book Review Editor: Tom Staley, Virginia Tech (tstaley@vt.edu)
Managing Editor: Ashley Shew (technejournal@gmail.com)

Number 2

Spring 2009

Volume 13

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Special Issue: Artefacts in Analytic Metaphysics

Front CoverPDF [46 KB]

Table of ContentsPDF [38 KB]

Entire JournalPDF [1.4 MB]

Editor-in-Chief Joseph C. Pitt, Virginia Tech jcpitt@vt.edu
Editors Peter-Paul Verbeek, University of Twente
Pieter Vermaas, Delft University of Technology
Book Review Editor: Tom Staley, Virginia Tech tstaley@vt.edu
Managing Editor: Ashley Shew technejournal@gmail.com
Special Issue Editors: Wybo Houkes, Eindhoven Univ. of Technology
Pieter Vermaas, Delft University of Technology

CONTENTS

Artefacts in Analytic Metaphysics: Introduction
WYBO HOUKES and PIETER E. VERMAASPDF [152 KB]

The Metaphysics of Malfunction
LYNNE RUDDER BAKERPDF [192 KB]

Antirealism and Artefact Kinds
MARZIA SOAVIPDF [229 KB]

Relative Identity and the Number of Artifacts
MASSIMILIANO CARRARAPDF [265 KB]

Produced to Use: Combining Two Key Intuitions on the Nature of Artefacts
WYBO HOUKES and PIETER E. VERMAASPDF [217 KB]

What is an Artefact Design
PAWEL GARBACZPDF [424 KB]

Structure and Coherence of Two-Model-Descriptions of Technical Artefacts
ULRICH KROHSPDF [255 KB]

BOOK REVIEWSPDF [232 KB]

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Last modified on: 09/15/09 09:43:07 by ASL